Skip links
Call Us Today For A Free Quote!

HIGH POWER BURN-IN SOLUTION

https://innovative-circuits-engineering-11063f5.ingress-baronn.ewp.live/innovative-circuits-engineering-ice-expands-its-high-power-ai-semiconductor-testing-capabilities/Protocol Aware Engine – SOC TL Adaptive Test and Flow Management Functional and BIST / ATPG Tests Parametric DfRT, Failure Time Device ID

  • Powered by ELES RETE for Augmented Stress and Test coverage with dedicated HW and SW Algorithms IPs to reach Zero Escape qualification
  •  Fast reaction to prevent thermal runaway and accurate thermal control to
  • optimize thermal stress
  •  Inert thermal vector: No risk to damage electronic in case of leakages
  •  Controlled temperature in the oven in order not to stress the electronic
  • components on board
  •  In-situ Test capabilities and extended data collection
  •  Purge with nitrogen or dry air to avoid DUTs oxidation
  •  Single device temperature control
  •  Automatic calculation of DUTs Equivalent Lifetime
  •  Large device observability and extended data collection
  •  Dedicated SW tools to support data interpretation

From Pass/Fail To Learn From Fail Smart Qualification With Zero Escape Manufacturing With 100% Yield

TECHNICAL:

Test Platform (per test slot):

  • 288 I/O channels – 20MHz Test Rate
  • APG – Flexible algorithmic pattern generator
  • 4GB on board pattern memory (512MV)
  • On-fly pattern fast reloading
  • Real time Monitoring and logging capability
  • Voltage & Current measurement capability

Power Supply Platform (per test slot):

  • 6 basic power supplies ±20V – 12.5A – 60W
  • 1 High Current Power Supply: 3.2 KW
  • Local on BIB Device Power Supply – per DUT
  • Max # of DUT per BIB: up to 24 (>>96 DPS on BIB)
  • Very fast Transient response, 10mV precision
  • Current / Voltage measurement per single DPS
  • Power sequence management

Thermal Platform (2 stacked chambers):

  • 2 Temperature zones, 6 Test slots each
  • Temperature range to 150°C High Temperature
  • Uniformity / Accuracy: ±3°C
  • Fast Temperature gradient: 5°C /min with devices
  • turned off, thermal mass included
  • Programmable Logic Controller for oven control,
  • Self-diagnostic and facilities parameters logging
  • More than 2x20KW dissipated (*)
  • Programmable setpoint during test

Local Temperature Control:

  • Single device temperature control

 

🍪 This website uses cookies to improve your web experience.