High Temperature Storage Test 

High Temperature Storage Test

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-to-failure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used without electrical conditions applied. This test may be destructive, depending on time, temperature and packaging (if any).

Reference Spec: 

JESD22-A101

Temperature Range: up to +243°C

Digital setpoint controller

 

Overtemp controller

 

Mechanical convection oven

 
High Temperature Storage Test, reliability lab.