High Power Burn-in Solution | Power System Testing

Slide 1
High Power Burn-in Solution
Up to 1000 Watts
 per DUT

Powered by ELES RETE for Augmented Stress and Test coverage with dedicated HW and SW Algorithms IPs to reach Zero Escape qualification

high power system tests, power system testing

Protocol Aware Engine – SOC TL
Adaptive Test and Flow Management
Functional and BIST / ATPG Tests
Parametric DfRT, Failure Time
Device ID

  • Powered by ELES RETE for Augmented Stress and Test coverage with dedicated HW and SW Algorithms IPs to reach Zero Escape qualification
  • Fast reaction to prevent thermal runaway and accurate thermal control to
  • optimize thermal stress
  • Inert thermal vector: No risk to damage electronic in case of leakages
  • Controlled temperature in the oven in order not to stress the electronic
  • components on board
  • In-situ Test capabilities and extended data collection
  • Purge with nitrogen or dry air to avoid DUTs oxidation
  • Single device temperature control
  • Automatic calculation of DUTs Equivalent Lifetime
  • Large device observability and extended data collection
  • Dedicated SW tools to support data interpretation

From Pass/Fail To Learn From Fail | Smart Qualification With Zero Escape | Manufacturing With 100% Yield

Technical

Test Platform (per test slot)

  • 288 I/O channels - 20MHz Test Rate
  • APG – Flexible algorithmic pattern generator
  • 4GB on board pattern memory (512MV)
  • On-fly pattern fast reloading
  • Real time Monitoring and logging capability
  • Voltage & Current measurement capability

Power Supply Platform (per test slot)

  • 6 basic power supplies ±20V - 12.5A - 60W
  • 1 High Current Power Supply: 3.2 KW
  • Local on BIB Device Power Supply - per DUT
  • Max # of DUT per BIB: up to 24 (>>96 DPS on BIB)
  • Very fast Transient response, 10mV precision
  • Current / Voltage measurement per single DPS
  • Power sequence management

Thermal Platform (2 stacked chambers)

  • 2 Temperature zones, 6 Test slots each
  • Temperature range to 150°C High Temperature
    Uniformity / Accuracy: ±3 °C
  • Fast Temperature gradient: 5° C /min with devices
    turned off, thermal mass included
  • Programmable Logic Controller for oven control,
    self diagnostic and facilities parameters logging
  • More than 2x20KW dissipated (*)
  • Programmable setpoint during test

Local Temperature Control

  • Single device temperature control