FAILURE ANALYSIS LEVEL 1

CSAM SCANNING ACOUSTIC MICROSCOPY

• Two Sonix Echo VS Hi Speed Systems.
• One Sonix UHR-2001 High Speed System.
• Provides C-Scan, B-Scan, Through Scan, Tami Scan and A-scan.
• Transducers from low to very high frequencies.
• High resolution images.
• Images can be emailed or printed on high quality paper.
• Comprehensive detailed final reports.
• Accommodates single chips, boards, strips, trays and more.
• Detects delamination and many other package related defects.
• Non Destructive Test.
• Experienced Engineers offering Advanced Expert Level Microscope Operation.