Human Body Model (HBM)
The HBM test characterizes the susceptibility of an electronic device to damage from electrostatic discharge (ESD) induced by human handling. The model is a simulation of the discharge which might occur when an electrostatic charged human touches an electronic device.
Machine Model (MM)
This model simulates the incidents of electrostatic discharge that might occur through automated handling equipment or hand-tools and the electronic device to ground.
Charged Device Model (CDM)
This model simulates the electrostatic discharge incident when the electronic device itself acquires electrostatic charges through friction or induction process, then a discharge might occur through grounded object or surface.
Latch-up (LU)
This test simulates an integrated circuit failure mechanism characterized by excessive current flow between the power supply and ground. Latch up occurs when a low-impedance path, resulting from an overstress that triggers a parasitic thyristor structure, persists after removal or cessation of the triggering condition.
System Level Electrostatic Discharge
System level electrostatic discharge is carried on an assembled board, or complete system to simulate the ESD incidents that might occur after assembling the electronic device to the board or system.