At Innovative Circuits Engineering, Inc. we believe that quality, service and custom solutions should all run hand in hand. Our burn in services and our burn in department is a good example of this.
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
Our burn-in department can also work with you to create custom temperature solutions. All we need to know is what your specific needs are and our burn-in specialists will work with you hand-in-hand to create a custom solution that meets your burn-in needs.
HTOL – HIGH TEMPERATURE OPERATING LIFE
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way.
LTOL – LOW TEMPERATURE OPERATING LIFE
This test may use similar conditions as the High Temperature Operating Life Test but at Cold Temperatures.
ELFR – EARLY LIFE FAILURE RATE
This test provides early life failure characteristics for new or unproven technologies when generic data is not available.
This test is used to determine the effects of RF bias conditions and temperature on Power Amplifier Modules (PAMs) , Switches, Transceivers, Tuners, and other RF components over time. It simulates the devices’ operating condition in an accelerated way.
PTC – POWER TEMPERATURE CYCLES
This test is performed to determine the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed.
THB – TEMPERATURE HUMIDITY BIAS TEST
This standard establishes a defined method and conditions for performing a temperature humidity life test with bias applied.
HAST – HIGHLY ACCELERATED STRESS TEST
The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments.
LM-80 – LUMEN MAINTENANCE TEST
Measuring Lumen Maintenance of LED Light Sources