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Innovative Circuits Engineering | Reliability Testing | Failure Analysis Services | ESD Testing Services | Reliability Lab
  • Reliability Test Lab
    • Preconditioning
    • Temperature Cycling Test
    • Thermal Shock
    • Autoclave/Pressure Pot
    • High Temperature Storage Test 
    • Low Temperature Storage Test
    • Cycled Temperature Humidity Bias Life Test
    • HAST Test
    • Power Temp Cycles
    • Temperature Humidity Bias Test
    • Board Level Reliability Testing – BLRT
    • Reliability Systems
  • PCB Design & PCB Assembly
  • Burn In Services
    • ELFR – Early Life Failure Rate
    • LTOL – Low Temp Operating Life
    • HTOL – High Temp Operating Life
    • RF HTOL (CW, GSM and others)
    • High Power Burn-in Solution | Power System Testing
    • Burn-in Systems
  • ESD Testing
  • Failure Analysis
    • Failure Analysis – Level 1
      • Real-Time X-Ray Services
      • External Visual Inspection Services
      • CSAM Scanning Acoustic Microscopy
      • Electrical Characterization | Curve Tracing Failure Analysis
    • Failure Analysis – Level 2
      • Chemical Deprocessing and Laser Decapsulation
      • Decapsulation
      • Quantum Focus Instruments (QFI)
      • Micromanipulator Probing
    • Failure Analysis – Level 3
      • Multi-purpose Bond Strength Testing
      • Dye Penetrant (Dye/Pry) Test
      • SEM / EDX Test
      • Cross Sectioning / Optical Microscopy
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Home
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2017
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November
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November
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Page 4

Month: November 2017

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access_timeNovember 8, 2017 mode_comment0

Plasmatics Plasma EtcherDigital now availble at Innovative Circuits Engineering

ICE is proud to announce its newest equipment acquisition -  Plasmatics Plasma Etcher Digital. It has advanced controls for better programming and control of the gases, allowing for better control of how fast or slow the etching is performed – weather etching layers, p...

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access_timeNovember 8, 2017 mode_comment0

ICE is proud to announce the addition of the Micrion 9500 FIB (Focused Ion Bean) System to its capabilities list.

For trace cutting, cross-section, and circuit editing to help isolate portions of a silicon die circuit when performing failure analysis and device structure analysis. The Micrion 9500 “Focused Ion Beam

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access_timeNovember 8, 2017 mode_comment0

2013 end of year message

December 16, 2013 Dear Customer, It is time again to send our warmest greetings and best wishes to you for the Holiday Season and the New Year. It is also the time to thank you for your business and for your trust and confidence in ICE for over 23 years. We are always...

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access_timeNovember 7, 2017 mode_comment0

ICE adds the Hitachi S4800 SEM to its Equipment List

ICE has just added the Hitachi S4800 SEM (Scanning Electron Microscope) to its equipment list. Better image quality due to a higher resolution of the image, and scatter capability which helps to differentiate between different metals. The Hitachi S-4800 field emis...

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RELIABILITY TESTING SERVICES

  • Preconditioning
  • Temperature Cycling Testing
  • Thermal Shock
  • Autoclave/Pressure Pot
  • High Temp Storage
  • Low Temp Storage
  • Cycled Temp Humidity Bias
  • HAST Test
  • Power Temp Cycles
  • Temperature Humidity Bias Test
  • Reliability Systems
  • Board level Reliability Testing

.

PCB DESIGN & ASSEMBLY SERVICES

BURN-IN SERVICES SERVICES

  • ELFR – Early Life Failure Rate
  • LTOL – Low Temp Operating Life
  • HTOL – High Temp Operating Life
  • LM-80 – Lumen Maintenance Test
  • RF HTOL(CW, GSM and others)
  • Burn-in Systems

ESD TESTING SERVICES

FAILURE ANALYSIS SERVICES

  • Failure Analysis Services – Level 1
  • Failure Analysis Services – Level 2
  • Failure Analysis Services – Level 3
  • CSAM Acoustic Analysis

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Innovative Circuits Engineering | Reliability Testing | Failure Analysis Services | ESD Testing Services | Reliability Lab

Innovative Circuits Engineering Inc.
2310 Lundy Ave, San Jose, CA 95131

408.955.9505

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