This test is for evaluation of early life failure characteristics on parts that are utilizing new or unproven processing technology or design rules where generic data is not available.

Standards Supported include:

• AEC-Q100-008-Rev-A  (Automotive)

• JESD22-A108

We can support a variety of device needs and configurations.

• I160 Systems:      160 signals, 4 power supplies, Logging, Sine wave option

• 8160: Systems:    144 signals, 8 power supplies, Logging, Sine wave option

• 8160HX System:  144 signals, 13 power supplies, Logging, High current, Site thermal control, Sine wave option

• ICE RF Systems:   32 signals, 7 power supplies, Logging, RF modulation