HTOL Test

HTOL Test

The HTOL test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document.

We can suport a varity of device needs and configurations.

  • I160 Systems:      160 signals, 4 power supples, Logging, Sine wave option

  • 8160: Systems:    144 signals, 8 power supplies, Logging, Sine wave option

  • 8160HX System:  144 signals, 13 power supplies, Logging, High current, Site thermal control, Sine wave option

  • ICE RF Systems:   32 signals, 7 power suuplies, Logging, RF modulation

Reference Spec:

JESD22-A108
 
HTOL Test, HTOL, HTOL Services