A LTOL test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device’s operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring.

• Temperature range: 0°C to -55°C.
• Fully Dynamic capability from 40 up to 160 channels.
• Burn-in vectors are Eprom programmable or pattern downloadable.
• Back plane configured with 4:1 capability.
• System Configured with 4 power supplies or up to 8 power supplies.
• System is designed to accept Criteria V, 8160 or I160 type boards.
• Equipped with all the safety features.