Low Temperature Storage Test

Low Temperature Storage Test

Low Temperature Storage Tests are applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. Low Temperature storage test is typically used to determine the effect of time and temperature, under storage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). During the test reduced temperatures (test conditions) are used without electrical stress applied. This test may be destructive, depending on Time, Temperature and Packaging (if any).

  • Temperature Range: -75°C to +200°C

  • Control tolerance of 0.3°C

  • Hermetic refrigeration system

  • Double silicon gaskets on doors

  • Viewing window, 6″ x 8″, thermally insulated and heated (no manual wiper required)

  • Interior lighting

  • Shelving, adjustable and removable
 
Low Temperature Storage test, LTOL