SEM/EDX Test
Hitachi S-4800 SEM with IXRF EDX
SEM Image illustrating EDX location
EDX chemical spectrum
-The Hitachi S-4800 field emission scanning electron microscope features a maximum resolution of 1.0 nm and a variable acceleration voltage of 0.5 - 30 kV.
- SEM is used to inspect cross sections and parallel lapping samples.
- A SEM / EDX Test is also used to inspect small SMT and other devices up to 100K magnification, -With the IXRF EDX we can determine what elements are present at a particular area of interest. This evidence provides analysis that may lead to a root cause of a failure.