For trace cutting, cross-section, and circuit editing to help isolate portions of a silicon die circuit when performing failure analysis and device structure analysis. The Micrion 9500 “Focused Ion Beam
December 16, 2013 Dear Customer, It is time again to send our warmest greetings and best wishes to you for the Holiday Season and the New Year. It is also the time to thank you for your business and for your trust and confidence in ICE for over 23 years. We are always...
ICE has just added the Hitachi S4800 SEM (Scanning Electron Microscope) to its equipment list. Better image quality due to a higher resolution of the image, and scatter capability which helps to differentiate between different metals. The Hitachi S-4800 field emis...
